发明名称 SILICON WAFER FOR EPITAXIAL WAFER, EPITAXIAL WAFER, AND METHOD OF MANUFACTURE THEREOF
摘要 <p>A silicon wafer is provided that includes no voids in its surface for epitaxial growth. For example, a nitrogen-doped silicon wafer is heat-treated at 1100 to 1300 DEG C in a non-oxidizing atmosphere, then at 700 to 1300 DEG C in an oxidizing atmosphere while keeping the temperature above 700 DEG C. The epitaxial wafer thus provided is free from epitaxial stacking faults.</p>
申请公布号 WO0138611(A1) 申请公布日期 2001.05.31
申请号 WO2000JP08204 申请日期 2000.11.21
申请人 SHIN-ETSU HANDOTAI CO., LTD.;KIMURA, AKIHIRO;SATO, HIDEKI;KONO, RYUJI;KATO, MASAHIRO;TAMATSUKA, MASARO 发明人 KIMURA, AKIHIRO;SATO, HIDEKI;KONO, RYUJI;KATO, MASAHIRO;TAMATSUKA, MASARO
分类号 H01L21/205;C30B15/00;C30B29/06;H01L21/20;H01L21/324;(IPC1-7):C30B29/06 主分类号 H01L21/205
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