| 摘要 |
<p>A decompressor/PRPG (36) on a microchip performs both pseudo-random test pattern generation and decompression of deterministic test patterns for a circuit-under-test (24) on the chip. The decompressor/PRPG (36) has two phases of operation. In a pseudo-random phase, the decompressor/PRPG (36) generates pseudo-random test patterns that are applied to scan chains (26) within the circuit-under-test (24). In a deterministic phase, compressed deterministic test patterns from an external tester (21) are applied to the decompressor/PRPG (36). The patterns are decompressed as the patterns are clocked through the decompressor/PRPG (36) into the scan chains (26).</p> |
