| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing and adjusting method for a microwave semiconductor device which shortens the time for electric characteristic measurement and adjustment by eliminating a screw-fixing process and matches characteristics in the adjustment with characteristics after sealing by ensuring electromagnetic shielding. SOLUTION: A cover having no gap is formed by continuously joining a metal foil cover with a chassis to secure electromagnetic shielding and the electric characteristics can stably be tested and adjusted. This metal foil cover is easily peeled off, so its fitting and removal are easy to shorten the testing and adjusting operation time.
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