发明名称 |
SAMPLE SURFACE DEPOSIT INSPECTION SYSTEM, SAMPLE SURFACE DEPOSIT INSPECTION METHOD, SAMPLE SURFACE DEPOSIT ELIMINATION SYSTEM, SAMPLE SURFACE DEPOSIT STICKING SYSTEM AND SAMPLE SURFACE DEPOSIT DISPOSAL SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To provide a sample surface deposit inspection system, a deposit elimination system and a deposit sticking system capable of easily detecting deposit even on a rugged sample surface and efficiently eliminating static electric charge to eliminate the deposit from a base. SOLUTION: An ultraviolet light source 12 irradiates ultraviolet rays from every angle including the surface and back face of a solid or liquid sample. An optical system 13 converges the ultraviolet rays directly or through a lens or the like to irradiate the sample. An optical mechanism 13 has a measuring mechanism for recording the in-plane distributed image of fluorescent intensity radiated from the sample surface after the irradiation of ultraviolet rays, by an image pickup apparatus or the like, and a magnifying mechanism for the detection of the radiated fluorescence from the local part of the sample surface through a microscope, and guides the radiated fluorescence into a spectroscope 11. A moving mechanism can move these sample stage and observation system precisely in a wide range.
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申请公布号 |
JP2001147198(A) |
申请公布日期 |
2001.05.29 |
申请号 |
JP19990332081 |
申请日期 |
1999.11.22 |
申请人 |
KAWAI AKIRA |
发明人 |
KAWAI AKIRA |
分类号 |
G01N21/88;G01N21/89;G01N21/94;(IPC1-7):G01N21/88 |
主分类号 |
G01N21/88 |
代理机构 |
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