发明名称 |
Method of calculating thermal resistance in semiconductor package accommodating semiconductor chip within a case which can be applied to calculation for semiconductor package with radiation fins |
摘要 |
The thermal resistance of an entire semiconductor package with a semiconductor chip and radiation fins is calculated based on thermal resistance of resin between the semiconductor chip and case, thermal resistance of the radiation fins, and thermal resistance of three heat radiation paths in the semiconductor package. One of said three heat radiation paths is passing through the bottom surface of the case. The other of said three radiation paths is passing through the leadframe. The other of three radiation paths is passing through sides of the case other than the leadframe.
|
申请公布号 |
US6238086(B1) |
申请公布日期 |
2001.05.29 |
申请号 |
US19990239835 |
申请日期 |
1999.01.29 |
申请人 |
NEC CORPORATION |
发明人 |
MIKUBO KAZUYUKI;KITAJO SAKAE |
分类号 |
H01L23/34;G01K7/42;G01N25/18;(IPC1-7):G01N25/18;G01N25/20 |
主分类号 |
H01L23/34 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|