发明名称 Fluorescent X-ray analyzer with path switching device
摘要 A fluorescent X-ray analyzer has at least three optical detection paths along which the secondary fluorescent X-ray to be analyzed travels selectively and includes a monochromator (6) carried by a first spindle (14) having a longitudinal axis (O) passing in touch with a light receiving surface of the monochromator (6). A first detector (8A) for measuring the intensity of at least a portion of the secondary X-ray (7) monochromatized by the monochromator (6) while allowing the remaining portion of the secondary X-ray (7) to pass therethrough, and a light receiving slit member (11) for passing the secondary X-ray (7) monochromatized by the monochromator (6) therethrough are carried by a second spindle (17) in side-by-side relation in a circumferential direction. A third spindle (20) is utilized separate from the second spindle (17) for carrying a second detector (8B) for measuring the intensity of the secondary X-ray (7) having passed through the first detector (8A) or the light receiving slit member (11).
申请公布号 US6240159(B1) 申请公布日期 2001.05.29
申请号 US19990456480 申请日期 1999.12.07
申请人 RIGAKU INDUSTRIAL CORPORATION 发明人 KOHNO HISAYUKI;HIGAKI SHIROU
分类号 G01N23/223;G01J3/04;G01N23/207;G21K1/06;(IPC1-7):G01N23/223 主分类号 G01N23/223
代理机构 代理人
主权项
地址