发明名称 |
Fluorescent X-ray analyzer with path switching device |
摘要 |
A fluorescent X-ray analyzer has at least three optical detection paths along which the secondary fluorescent X-ray to be analyzed travels selectively and includes a monochromator (6) carried by a first spindle (14) having a longitudinal axis (O) passing in touch with a light receiving surface of the monochromator (6). A first detector (8A) for measuring the intensity of at least a portion of the secondary X-ray (7) monochromatized by the monochromator (6) while allowing the remaining portion of the secondary X-ray (7) to pass therethrough, and a light receiving slit member (11) for passing the secondary X-ray (7) monochromatized by the monochromator (6) therethrough are carried by a second spindle (17) in side-by-side relation in a circumferential direction. A third spindle (20) is utilized separate from the second spindle (17) for carrying a second detector (8B) for measuring the intensity of the secondary X-ray (7) having passed through the first detector (8A) or the light receiving slit member (11).
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申请公布号 |
US6240159(B1) |
申请公布日期 |
2001.05.29 |
申请号 |
US19990456480 |
申请日期 |
1999.12.07 |
申请人 |
RIGAKU INDUSTRIAL CORPORATION |
发明人 |
KOHNO HISAYUKI;HIGAKI SHIROU |
分类号 |
G01N23/223;G01J3/04;G01N23/207;G21K1/06;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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