| 摘要 |
PROBLEM TO BE SOLVED: To conduct a selection test of a test of a very-multiple-terminal LSI by an LSI tester which has a small number of terminals without incorporating a circuit dedicated to the test in the tested LSI. SOLUTION: This device is equipped with a test control means which outputs test control data TCD including settings of input/output modes of the tested LSI 32 by test patterns and a test interface board 3 is equipped with an LSI 31 for test control which supplies test patterns and input answer patterns by switching connections with respective terminals of the tested LSI 32 by an LSI tester 2 according to connection patterns for test implementation set under the control of a test control signal TC corresponding to the test control data TCD. |
