发明名称 ANALYSIS SAMPLE PREPARING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an analysis sample preparing device permitting the automation of an operator's work in preparing a sample for analysis such as polishing the sample. SOLUTION: This analysis sample preparing device is provided with a movable sample grip device movable while supporting the sample for analysis; a sample polishing means 4 for polishing the sample supported by the movable sample grip device 2; a polished surface inspecting means 5 for inspecting the polished surface of the polished sample for analysis; and a sample grip device control means for moving the movable sample grip device 2 to the sample polishing means 4 and the polished surface inspecting means 5 on the basis of information corresponding to the individual samples and the inspected result of the polished surface inspecting means 5.
申请公布号 JP2001147186(A) 申请公布日期 2001.05.29
申请号 JP19990329194 申请日期 1999.11.19
申请人 NKK CORP 发明人 NAKANOSONO MAKOTO;KANEKO SHIGEYA;YOSHINO KIMINORI;YONETSUKA KAZUYA
分类号 G01N1/32;(IPC1-7):G01N1/32 主分类号 G01N1/32
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