发明名称 |
ANALYSIS SAMPLE PREPARING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide an analysis sample preparing device permitting the automation of an operator's work in preparing a sample for analysis such as polishing the sample. SOLUTION: This analysis sample preparing device is provided with a movable sample grip device movable while supporting the sample for analysis; a sample polishing means 4 for polishing the sample supported by the movable sample grip device 2; a polished surface inspecting means 5 for inspecting the polished surface of the polished sample for analysis; and a sample grip device control means for moving the movable sample grip device 2 to the sample polishing means 4 and the polished surface inspecting means 5 on the basis of information corresponding to the individual samples and the inspected result of the polished surface inspecting means 5.
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申请公布号 |
JP2001147186(A) |
申请公布日期 |
2001.05.29 |
申请号 |
JP19990329194 |
申请日期 |
1999.11.19 |
申请人 |
NKK CORP |
发明人 |
NAKANOSONO MAKOTO;KANEKO SHIGEYA;YOSHINO KIMINORI;YONETSUKA KAZUYA |
分类号 |
G01N1/32;(IPC1-7):G01N1/32 |
主分类号 |
G01N1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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