发明名称 PRISM DEFECT DETECTING METHOD AND PRISM DEFECT DETECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To detect the defect of a prism by taking in an image at a time without performing focus scanning every take-in of the image of the prism. SOLUTION: This prism defect detecting device detects the defect of the tested prism 3 by making light from a light source 1 enter the tested prism 3 and processing the light emitted from the tested prism 3. The device is provided with a diaphragm mechanism 2 disposed between the light source 1 and the tested prism 3 to control the quantity of light, an image pickup means having an image pickup element for converting the image of the tested prism 3 into an electric signal, and an image processing means 10 for image-processing the output of the image pickup means and judging whether stripe, bubbles and foreign matters exist in the tested prism 3.
申请公布号 JP2001147176(A) 申请公布日期 2001.05.29
申请号 JP19990332152 申请日期 1999.11.24
申请人 OLYMPUS OPTICAL CO LTD 发明人 INAHASHI MAKIKO;ONO YOSHIAKI
分类号 G01N21/958;G01M11/00;(IPC1-7):G01M11/00 主分类号 G01N21/958
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