发明名称 Thermal oxidizing method for forming with attenuated surface sensitivity ozone-teos silicon oxide dielectric layer upon a thermally oxidized silicon substrate layer
摘要 A method for forming a trench isolation region within a trench within a silicon substrate. There is first provided a silicon substrate having a trench formed therein. There is then formed over the silicon substrate and filling the trench a silicon oxide trench fill layer. There is then thermally oxidized the silicon substrate and the silicon oxide trench fill layer within a thermal oxidation atmosphere to form a densified silicon oxide trench fill layer upon a silicon oxide trench liner layer within an oxidized trench within an oxidized silicon substrate, where the silicon oxide trench liner layer is formed from oxidation of the silicon substrate when forming the oxidized silicon substrate.
申请公布号 US6239002(B1) 申请公布日期 2001.05.29
申请号 US19980174660 申请日期 1998.10.19
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 JANG SYUN-MING;CHEN YING-HO;YU CHEN-HUA
分类号 H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/762
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