| 摘要 |
<p>An IC socket includes a probe pin (35) inserted into holes (33,34), which communicate with each other and penetrate a housing (31) and a back plate (32), respectively. The probe pin comprises a tubular structure (36) including a plunger (39) inserted into one end of a tube (38) with a stopper (38a) formed around it, a movable plunger (37) fitted in the other end of the tube and adapted to make pressure contact with a terminal of a device under test, and a coil spring (41) for pressing the movable plunger. Both ends of the tubular structure are positioned in the holes, a second coil spring (42) placed between the inside of the housing and the stopper pushes the stopper against the inside of the back plate, and the outer end of the fixed plunger protrudes beyond the outside of the back plate. The movable plunger keeps sliding smoothly with stable contact though it repeatedly moves up and down each time devices to be measured are changed.</p> |
