发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problems in prior art that in a circuit, having parallel connected working transistors and transistors being in a stopped state, the working transistors were broken due to the electrostatic discharge(ESD), since the junction breakdown, voltage of the working transistor is lower than the surface breakdown voltage of the transistor being in the stopped state. SOLUTION: In a circuit, having parallel connected working transistors and transistors which are in a stopped state, the gates of the working transistors are surrounded by the gate electrodes, to prevent the working transistors from being broken due to electrostatic discharge.
申请公布号 JP2001144185(A) 申请公布日期 2001.05.25
申请号 JP19990320158 申请日期 1999.11.10
申请人 SEIKO INSTRUMENTS INC 发明人 KITAMURA KENJI;OSANAI JUN
分类号 H01L27/04;H01L21/822;H01L21/8234;H01L23/60;H01L27/02;H01L27/088;H01L29/76;H01L29/78;H01L29/786;(IPC1-7):H01L21/823 主分类号 H01L27/04
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