发明名称 PRODUCING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To decrease the concentration of metal elements in a crystalline silicon film, for which the metal element for promoting the crystallization of silicon is utilized. SOLUTION: After a nickel element is led into an amorphous silicon film 103, first heating treatment for crystallization is executed. After a crystalline silicon film 105 is obtained, the heating treatment is executed again with the same heating method as first heating treatment. At such a time, HCl or the like is added into an atmosphere and gettering of the nickel element residual in the crystalline silicon film 105 is executed. Thus, the crystalline silicon film 105 having the low concentration of metal elements and high crystallinity can be provided. While using the crystalline silicon film provided like this, a semiconductor device is produced.
申请公布号 JP2001144016(A) 申请公布日期 2001.05.25
申请号 JP20000269584 申请日期 2000.09.06
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;TERAMOTO SATOSHI;KOYAMA JUN;MIYANAGA SHOJI;OTANI HISASHI
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 G02F1/136
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