发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device and its manufacturing method that suppress function of Vt and have an MOSFET, for preventing degree of integration from being reduced. SOLUTION: In a MOSFET provided in an element region being divided by a trench element separation region 2 formed on a P-type silicon substrate 1, the center part of a channel region 10 is set to a P--channel region 11 of low Vt, and each of both end parts near the boundary to the trench element separation region 2 is set to a P+-channel region 12 of high Vt.
申请公布号 JP2001144189(A) 申请公布日期 2001.05.25
申请号 JP19990327432 申请日期 1999.11.17
申请人 NEC IC MICROCOMPUT SYST LTD 发明人 ARAOKA YASUSHI;TAKAGI YOSHIHIRO
分类号 H01L21/76;H01L21/8234;H01L27/08;H01L27/088;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L21/76
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