发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device and its manufacturing method that suppress function of Vt and have an MOSFET, for preventing degree of integration from being reduced. SOLUTION: In a MOSFET provided in an element region being divided by a trench element separation region 2 formed on a P-type silicon substrate 1, the center part of a channel region 10 is set to a P--channel region 11 of low Vt, and each of both end parts near the boundary to the trench element separation region 2 is set to a P+-channel region 12 of high Vt.
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申请公布号 |
JP2001144189(A) |
申请公布日期 |
2001.05.25 |
申请号 |
JP19990327432 |
申请日期 |
1999.11.17 |
申请人 |
NEC IC MICROCOMPUT SYST LTD |
发明人 |
ARAOKA YASUSHI;TAKAGI YOSHIHIRO |
分类号 |
H01L21/76;H01L21/8234;H01L27/08;H01L27/088;H01L29/78;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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