发明名称 RELIABILITY TESTING METHOD OF CAPACITOR AND TESTING UNIT
摘要 <p>PROBLEM TO BE SOLVED: To provide a reliability test method of a capacitor for diagnosing deterioration in ages without detaching the capacitor to be tested during testing time. SOLUTION: In a circuit, a capacitor 5 to be tested and a DC power supply 1 for applying a DC current to the capacitor 5 are connected with a resistor 4 in between. The circuit comprises a control circuit 6 for applying the DC current intermittently at given timing to the capacitor 5 to be tested, and a time judgment circuit 7 that is synchronized with the intermittent cycle of the DC voltage for detecting and judging a voltage rising time or a voltage falling time. When the DC voltage is applied intermittently, the voltage rising time or the voltage falling time is detected and, on the basis of the result, a deterioration in ages of the capacitor 5 is judged.</p>
申请公布号 JP2001143977(A) 申请公布日期 2001.05.25
申请号 JP19990325128 申请日期 1999.11.16
申请人 CANON INC 发明人 IKEDA YUKITO
分类号 H01G13/00;(IPC1-7):H01G13/00 主分类号 H01G13/00
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