发明名称 PRODUCING METHOD FOR SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a producing method for semiconductor device, with which the deterioration of characteristics is prevented, and a semiconductor device. SOLUTION: In the case of heating a semi-insulated GaAs substrate 1 inside a reaction pipe and growing the compound of group III elements and group V elements on the GaAs substrate 1 with the method of vapor phase epitaxial growth, by leading oxygen into the reaction pipe just before growing a target epitaxial layer, a residual Si impurity, which can not be completely removed by sulfuric acid etching, is inactivated. As a result, a leak current between the GaAs substrate 1 and a buffer layer 2 is reduced and the deterioration of characteristics of the semiconductor device is prevented.
申请公布号 JP2001144018(A) 申请公布日期 2001.05.25
申请号 JP19990321248 申请日期 1999.11.11
申请人 HITACHI CABLE LTD 发明人 IGARASHI JUNICHI;MINAGAWA SHUNICHI;MEGURO TAKESHI
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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