发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve a frequency responsibility of a transistor, especially a vertical PNP transistor, in other words, to increase a cut-off frequency fT, in the manufacture of a semiconductor device including a bipolar transistor having a high cut-off frequency. SOLUTION: A P-type diffusion layer serving also as a side face collector region of a vertical PNP transistor is formed by vertically etching an N-type epitaxial layer which constitutes the vertical PNP transistor. Then, the P-type diffusion layer is formed on its side wall with an oxide film and then is filled with high melting point metal. The side face collector region itself is reduced in resistance and its width and diffusion depth, which have been expanded in a thermal diffusion, are not expanded. As a result, a parasitic capacity of the diffusion layer of the side face collector region is reduced and a collector capacity is also reduced as a whole, increasing a cut-off frequency fT of the vertical PNP transistor.
申请公布号 JP2001144098(A) 申请公布日期 2001.05.25
申请号 JP19990323488 申请日期 1999.11.15
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 ITO RYOICHI
分类号 H01L29/73;H01L21/28;H01L21/331;H01L21/74;(IPC1-7):H01L21/331 主分类号 H01L29/73
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