发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning probe microscope for easily observing the surface of a disk-shaped sample. SOLUTION: The scanning probe microscope consists of an optical signal pickup means 104 for detecting an observation position, a chassis 101 for mounting the pickup means 104, a slight-movement scanning means 102 in the direction of the radius of a disk and in a Z direction being mounted to the chassis 101, a guide rail 105 that freely slide the chassis in one direction, a motor 107 for rotating the disk, a Z rough-movement stage 108 for driving the motor 108 up and down in a height wise direction, a slight-speed rotary means 109 for slightly rotating and driving the rotary shaft of the motor while being mounted to the state 108, a displacement detection means 109 for detecting the displacement of the probe, a feedback circuit 111 for reading a signal from the means 110 and sending a Z-directional drive signal to the scanning means 102, a scanning circuit 112 in the direction of the radius of the disk and in the rotary direction of the disk for generating a scanning signal in the direction of the radius of the disk and in the rotary direction of the disk, and a motor 113.
申请公布号 JP2001141633(A) 申请公布日期 2001.05.25
申请号 JP20000138696 申请日期 2000.05.11
申请人 SEIKO INSTRUMENTS INC 发明人 HONMA KATSUNORI
分类号 G01B21/30;G01Q10/04;G01Q10/06;G01Q80/00;G11B7/26;H02N2/00 主分类号 G01B21/30
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