| 摘要 |
PROBLEM TO BE SOLVED: To shorten testing time by simultaneously conducting the DC characteristic tests of a plurality of input buffers per one step of the DC characteristic test. SOLUTION: This semiconductor integrated circuit is provided with a detection circuit which is set to any one detection mode of the all 'L' detection mode for detecting whether the input signals T1 to T6 are all 'L', depending on the designation of the detection mode designating signal TM, and the all 'H' detection mode for detecting whether the input signals are all 'H' and selectors S1 to S6 for selecting one of the test signal and test output signal TD of the internal circuit 1. The input buffers BI1 to BI6 and output buffers BO1 to BO6 are tested in the same test step, by outputting the test output signal TD to the output terminal via the output buffer.
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