发明名称 MATERIALS AND GAS CHEMISTRIES FOR PROCESSING SYSTEMS
摘要 <p>A plasma processing system for processing a substrate, is disclosed. The plasma processing system includes a single chamber, substantially azimuthally symmetric plasma processing chamber within which a plasma is both ignited and sustained for the processing. The plasma processing chamber has no separate plasma generation chamber. The plasma processing chamber has an upper end and a lower end. The plasma processing chamber includes a material that does not substantially react with the reactive gas chemistries that are delivered into the plasma processing chamber. In addition, the reactant gases that are flown into the plasma processing chamber are disclosed.</p>
申请公布号 WO2001037314(A1) 申请公布日期 2001.05.25
申请号 US2000031229 申请日期 2000.11.14
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