SEMICONDUCTOR TEST DEVICE, SEMICONDUCTOR MEMORY TEST DEVICE, SEMICONDUCTOR MEMORY TEST METHOD

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor test device, a semiconductor memory test device, and a semiconductor memory test method in which testing capability of a semiconductor device is maximized, and factors of rise of a device cost can be minimized, and test cost is reduced. SOLUTION: Relating to this device, high speed pin drivers 301, 302 are provided in a test head 200 in which normal pin drivers 304-306 are provided as main drivers, when second test capability is required, a signal formatted previously is supplied to the high-speed pin drivers 301, 302, in matching with the high-speed operation.