发明名称 Semiconductor integrated circuit device having double diffusion insulated gate field effect transistor
摘要 To provide a lateral double diffusion insulated gate field effect transistor with high driving current and low source-drain withstand voltage without receiving the influence of process fluctuation. Without shortening a gate electrode 10 as compared with conventional one, an impurity of the same conductivity type as a drain is ion-implanted from the side of a high concentration drain region 20 by using the gate electrode as a mask in a self-aligning manner. The amount of impurity implantation is set as higher than the concentration of a semiconductor substrate 19.
申请公布号 US6236084(B1) 申请公布日期 2001.05.22
申请号 US19990320111 申请日期 1999.05.26
申请人 SEIKO INSTRUMENTS INC. 发明人 HARADA HIROFUMI;OSANAI JUN
分类号 H01L21/336;H01L21/8238;H01L21/8249;H01L27/092;H01L29/08;H01L29/78;(IPC1-7):H01L29/76;H01L29/94 主分类号 H01L21/336
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