| 摘要 |
A method for testing sequential circuit designs in which an exhaustive sequence of test vectors is applied to the input nodes of edge-sensitive components of a simulated sequential circuit. The test vector values are selected from a group including a logic "1" (high), a logic "0" (low), a "floating" value (i.e., between logic "1" and logic "0") and a randomly generated ("don't care") value. While a predetermined combination of values is applied to all other input nodes of the simulated circuit, the sequence of test vector values is applied to a selected input node that produces all possible transitions between the test vector values. The predetermined combination of values applied to all other input nodes is then incrementally changed, and the test vector value sequence is repeated.
|
