| 摘要 |
Apparatus and processes for water impurity analysis and for impurity analysis of various other liquids as well. Apparatus and processes are provided for physical characterization of liquid drops as a liquid sample builds up and then drops from a sample needle or other source. Liquid drop characterization is through utilization of infrared liquid drop measuring and computer modeling to measure a liquid drop as it builds up and then measures the falling liquid drop. By optically measuring an infrared radiated falling drop, and/or by characterizing the manner by which a sample drop is formed, a very precise way of determining the exact volume of a liquid sample is accomplished. Sample volume is typically directly proportional to concentration levels of the chemical constituent to be measured. By computer modeling, a falling drop can be quantified as to volume, rather than depending on the otherwise standard way of injecting a "known" volume. Infrared-emitting light is shone through a quartz window and is directed onto an infrared detector with an optical filter in the water vapor/liquid band, and measures not only the falling drop, but drop formation as it builds up. The infrared detector provides a signal output representing sample drop measurement, which signal output is input to a computer or microprocessor for processing and display.
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