发明名称 Semiconductor device having deposited silicon regions and a method of fabrication
摘要 The present invention describes an MOS device having deposited silicon regions and its a method of fabrication. In one embodiment of the present invention a substrate having a thin oxide layer formed on a silicon surface is heated and exposed to an ambient comprising germane (GeH4) to remove the thin oxide from the silicon surface. A silicon or silicon alloy film can then be deposited onto the silicon surface of the substrate.
申请公布号 US6235568(B1) 申请公布日期 2001.05.22
申请号 US19990235782 申请日期 1999.01.22
申请人 INTEL CORPORATION 发明人 MURTHY ANAND;JAN CHIA-HONG;ANDIDEH EBRAHIM;WELDON KEVIN
分类号 H01L21/8238;(IPC1-7):H01L21/823;H01L21/336 主分类号 H01L21/8238
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