APPARATUS FOR TESTING MULTI-TERMINAL ELECTRONIC COMPONENTS

摘要

To facilitate the testing of small electronic components, an improved test probe and transport wheel assembly are disclosed. The basic form of the probe features a fixed support body onto which a movable base is secured by at least one resilient structure. Secured to the movable base are a number of leads that may be moved through complementary tunnels in a fixed guide block toward the side-located terminals of an electronic component to be tested. The transport wheel assembly includes a wheel that has a number of peripherally-located compartments for receiving the electronic components. Each of the compartments includes a metal base. Also disclosed is a metal roller that is designed to press on an end of a component during testing. The metal base of each compartment and the metal roller facilitate electrical connection to the component's end-located terminals by side-located leads from the test probe.