发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a technique for improving controllability of a base width regarding a method for manufacturing a semiconductor device where a vertical PNP transistor in that a P-type semiconductor substrate composes a collector region is formed on a semiconductor substrate where an epitaxial growth layer for composing an N-type base region is formed on the P-type semiconductor substrate. SOLUTION: In the method for manufacturing a semiconductor device where a base region is formed on an epitaxial growth layer and a vertical PNP transistor I in that a substrate composes a collector region is formed on a semiconductor substrate where an N-type epitaxial growth layer 6 is formed on a P-type semiconductor substrate 1, the epitaxial growth layer is formed, then ion implantation III is performed from the upper portion of the epitaxial growth layer only to a region where the PNP transistor is formed, and a high-concentration P-type region 30 is formed near the substrate surface, thus controlling a base width.
申请公布号 JP2001135643(A) 申请公布日期 2001.05.18
申请号 JP19990314392 申请日期 1999.11.04
申请人 SONY CORP 发明人 UEKI YOSHIO
分类号 H01L29/73;H01L21/331;H01L21/8228;H01L27/082;(IPC1-7):H01L21/331;H01L21/822 主分类号 H01L29/73
代理机构 代理人
主权项
地址