发明名称 FILM FORMING METHOD AND FILM FORMING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a film forming method whereby voids or seams can be blocked from growing, if design rules are severe. SOLUTION: For depositing a film on a semiconductor wafer, using an organic material e.g. TEOS, the working temperature among the working conditions is set to the thermal decomposition start temperature of TEOS, the organic material, e.g. within a range of 550-640 deg.C and the working pressure is set within a range of 266-798 Pa (2.0-6.0 Torr), thereby forming a film good in burying characteristics without growing voids or seams.
申请公布号 JP2001135581(A) 申请公布日期 2001.05.18
申请号 JP19990313015 申请日期 1999.11.02
申请人 TOKYO ELECTRON LTD 发明人 KATO HISASHI;FUJITA YOSHIYUKI;UENISHI MASAHIKO;UCHIUMI IKUKO
分类号 H01L21/76;C23C16/40;H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/76
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