| 摘要 |
PROBLEM TO BE SOLVED: To provide a laser diffraction/scatter type particle-size distribution measuring device capable of accurately measuring a continuous size distribution, including blue-color particles, widely ranging from the submicron order to hundreds/thousands ofμm. SOLUTION: A semiconductor laser 1 having output wavelengths of 300 to 500μm is used as a light source of an irradiation optical system for irradiating a group of measured particle P, thereby lowering the lower limit of a measurable range of particle sizes. A single wavelength is used and the measurement is carried out based on a single measurement principle. This enables particle size distribution to be measured without any points of discontinuity.
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