TIMING PULSE GENERATING CIRCUIT FOR IC TESTER, AND IC TESTER

摘要

PROBLEM TO BE SOLVED: To easily realize an IC tester capable of carrying out high speed transfer of a timing control data, capable of reducing a circuit space and capable of miniturizing a scale. SOLUTION: The second test cycle pulse generating circuit having constitution substantially same to a test cycle pulse generating circuit existing in a pattern generating side and generating a test cycle pulse equivalent to a test cycle pulse thereof is provided inside a timing pulse generating circuit, a timing control data output from a pattern generating circuit is received to generate the test cycle pulse, the test cycle pulse is thereby generated independently on the test cycle pulse generating circuit in the pattern generating side, and analog lag adjustment by a transfer time adjusting circuit and the like required conventionally is eliminated since timing for receiving the timing control data output from the pattern generating circuit and timing for obtaining it are timing- adjusted in a buffer circuit by the test cycle pulse of the second test cycle pulse generating circuit.