发明名称 TEMPERATURE DETECTOR FOR SEMICONDUCTOR MODULE
摘要 PROBLEM TO BE SOLVED: To minimize the error of a detected temperature in the detection of the temperature of a semiconductor module consisting of a plurality of IGBT elements. SOLUTION: In this detector, temperature detecting diodes 12, 22 and 32 are provided on IGBT elements 11, 21 and 31, respectively, and the diodes 12, 22 and 32 are connected in parallel, a constant current is supplied thereto from a constant current source 40 to detect the temperature of a semiconductor module in a temperature detecting circuit 50. Resistors 13, 23 and 33 are serially connected to the temperature detecting diodes 12, 22, and 32, respectively.
申请公布号 JP2001133330(A) 申请公布日期 2001.05.18
申请号 JP19990311448 申请日期 1999.11.01
申请人 DENSO CORP 发明人 FUKUDA YUTAKA;ITO MAKOTO;YAGI KENJI;MIURA SHOJI
分类号 H01L27/04;G01K7/01;H01L21/822;H01L29/861;(IPC1-7):G01K7/01 主分类号 H01L27/04
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