发明名称 |
METHOD AND APPARATUS FOR FLUORESCENT MAGNETIC PARTICLE FLAW DETECTION |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus, for a fluorescent magnetic particle flaw detection, in which the height of the apparatus can be kept within a limitation range while a desired flaw-detection visual field is ensured. SOLUTION: A flaw which exists on the surface W1 of a material W to be inspected is detected by fluorescent magnetic particles. The image on the surface W1 of the material W to be inspected by a static-image imaging means E which is used to image the static image of the material W to be inspected is refracted by a reflecting mirror 13.
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申请公布号 |
JP2001133415(A) |
申请公布日期 |
2001.05.18 |
申请号 |
JP19990314344 |
申请日期 |
1999.11.04 |
申请人 |
DAIDO STEEL CO LTD |
发明人 |
TAKADA KENICHI;YANO TAIZO |
分类号 |
G01N21/91;G01N21/89;(IPC1-7):G01N21/91 |
主分类号 |
G01N21/91 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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