发明名称 METHOD AND APPARATUS FOR FLUORESCENT MAGNETIC PARTICLE FLAW DETECTION
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus, for a fluorescent magnetic particle flaw detection, in which the height of the apparatus can be kept within a limitation range while a desired flaw-detection visual field is ensured. SOLUTION: A flaw which exists on the surface W1 of a material W to be inspected is detected by fluorescent magnetic particles. The image on the surface W1 of the material W to be inspected by a static-image imaging means E which is used to image the static image of the material W to be inspected is refracted by a reflecting mirror 13.
申请公布号 JP2001133415(A) 申请公布日期 2001.05.18
申请号 JP19990314344 申请日期 1999.11.04
申请人 DAIDO STEEL CO LTD 发明人 TAKADA KENICHI;YANO TAIZO
分类号 G01N21/91;G01N21/89;(IPC1-7):G01N21/91 主分类号 G01N21/91
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