发明名称 AUTOMATIC ANALYZER
摘要 PROBLEM TO BE SOLVED: To remove contaminants from a probe effectively. SOLUTION: At the position of a cleaning bath 20 for inserting a sampling probe 16, a cleaning water introduction pipe 23 is provided while surrounding the sampling probe 16 and a vacuum pump 27 is provided while being coupled with a vacuum pump for sucking outer air through the cleaning water introduction pipe 23. Cleaning water is delivered to the sampling probe 16 while sucking outer air through the vacuum pump. Since turbulence is generated in the cleaning water introduction pipe 23, samples adhering to the sampling probe 16 can be washed away cleanly and effectively by means of water flow and air flow.
申请公布号 JP2001133466(A) 申请公布日期 2001.05.18
申请号 JP19990315973 申请日期 1999.11.05
申请人 TOSHIBA CORP 发明人 SHIMIZU YOSHIAKI
分类号 G01N35/10;(IPC1-7):G01N35/10 主分类号 G01N35/10
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