| 摘要 |
PROBLEM TO BE SOLVED: To provide a test method for a RAM by which a test time of a semiconductor device incorporating plural RAMs can be shortened. SOLUTION: In a semiconductor device incorporating RAMs of at least two or more, the quality of a RAM in which the number of words are the least is verified independently, after common test data is written in each of all RAMs in parallel over all words of a RAM in which the number of words are the most, test data is read out from each of all RAMs in parallel, test data read out from the RAM in which the number of words are the least is compared with test data read out from each of residual all RAMs excluding RAM in which the number of words is the least in parallel in the semiconductor device, and the compared result is outputted to the outside of the semiconductor device.
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