发明名称 |
Production of conducting pathways comprises applying a metal layer and an insulating layer to a substrate, producing nitride and photoresist layers, forming a resist mask |
摘要 |
Production of conducting pathways comprises applying a metal layer (1) to a substrate with integrated circuits; applying an insulating layer (2) to the metal layer; producing a TiN layer (3) and subsequently a photoresist layer (5); producing a first resist mask by forming a first hole pattern in the photoresist layer; removing the TiN layer exposed in openings (6) and the insulating layer underneath; removing the photoresist layer and the TiN layer; and depositing metal in the trenches and contact holes. An Independent claim is also included for a process for the production of the conducting pathways. Preferred Features: An anitreflection layer formed by a SION layer (4) is arranged between the photoresist layer and the TiN layer. The TiN layer is applied using a reactive plasma sputtering process.
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申请公布号 |
DE10000004(A1) |
申请公布日期 |
2001.05.17 |
申请号 |
DE20001000004 |
申请日期 |
2000.01.03 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
LEIBERG, WOLFGANG;BAUCH, LOTHAR;GRANDREMY, GREGOIRE;STEINBACH, ANDREAS;BRASE, GABRIELA |
分类号 |
H01L21/768;(IPC1-7):H01L21/768;H01L21/283 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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