发明名称 |
ALKALINE ETCHING SOLUTION AND PROCESS FOR ETCHING SEMICONDUCTOR WAFERS |
摘要 |
A process and an alkaline solution for etching a silicon wafer has been discovered wherein the wafer is subjected to an aqueous etching solution comprising a base and an oxidizing agent, wherein the base is comprised of a metal hydroxide such as sodium hydroxide or potassium hydroxide and the oxidizing agent is comprised of hydrogen peroxide or ozone, which enables the enhanced benefits of alkaline etching with reduced surface roughness.
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申请公布号 |
WO0134877(A1) |
申请公布日期 |
2001.05.17 |
申请号 |
WO2000US28238 |
申请日期 |
2000.10.12 |
申请人 |
MEMC ELECTRONIC MATERIALS, INC. |
发明人 |
STEFANESCU, ANCA;ERK, HENRY, F. |
分类号 |
H01L21/306;(IPC1-7):C23G1/14;C23F1/32;C23F1/40 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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