| 摘要 |
An integrated circuit (IC) tester includes a separate arbitrary waveform generator (AWG) for each input terminal of an IC to be tested. Each AWG generates a test signal input to the IC terminal that linearly ramps between discrete levels to approximate a smoothly varying waveform. Each AWG includes a digital-to-analog converter (DAC) formed by a set of N ramp generators, with each ramp generator producing output currents that ramp at adjustable rates between discrete levels in response to a change in state of an input waveform data bit. The output currents of all N ramp generators of the DAC, which have separately weighted magnitude levels, are summed and converted to a proportional voltage to produce the AWG's test signal. |
