发明名称 METHOD FOR PROVIDING PULSED PLASMA DURING PORTION OF SEMICONDUCTOR WAFER PROCESS
摘要 PURPOSE: Disclosed is a method for providing a pulsed plasma during a portion of a semiconductor wafer process. CONSTITUTION: The method for processing a semiconductor wafer with a plasma using continuous RF power for a first phase of wafer processing and with pulsed RF power for a second phase of wafer processing. At this time, the wafer processing is an etch process including a main etching treatment and an over etching treatment. Also, the duty cycle against of the pulsed RF power has range from 10% to 90%.
申请公布号 KR20010039749(A) 申请公布日期 2001.05.15
申请号 KR20000042402 申请日期 2000.07.24
申请人 APPLIED MATERIALS INC. 发明人 LOEWENHARDT PETER K.;PATERSON ALEX;YAMARTINO JOHN M.;ZAWALSKI WADE
分类号 H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):H01L21/306 主分类号 H01L21/302
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