发明名称 |
METHOD FOR PROVIDING PULSED PLASMA DURING PORTION OF SEMICONDUCTOR WAFER PROCESS |
摘要 |
PURPOSE: Disclosed is a method for providing a pulsed plasma during a portion of a semiconductor wafer process. CONSTITUTION: The method for processing a semiconductor wafer with a plasma using continuous RF power for a first phase of wafer processing and with pulsed RF power for a second phase of wafer processing. At this time, the wafer processing is an etch process including a main etching treatment and an over etching treatment. Also, the duty cycle against of the pulsed RF power has range from 10% to 90%.
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申请公布号 |
KR20010039749(A) |
申请公布日期 |
2001.05.15 |
申请号 |
KR20000042402 |
申请日期 |
2000.07.24 |
申请人 |
APPLIED MATERIALS INC. |
发明人 |
LOEWENHARDT PETER K.;PATERSON ALEX;YAMARTINO JOHN M.;ZAWALSKI WADE |
分类号 |
H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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