发明名称 Method for increasing surface area of a bottom electrode for a DRAM
摘要 A method of increasing a surface area of a bottom electrode for a DRAM. A polysilicon layer is formed. An etching process is performed and the polysilicon layer is etched into a surface having protrusions in order to increase the surface area of the polysilicon layer. A redox reaction is performed and the etched polysilicon layer is transformed to a metal layer by use of a solution; thus, the original appearance is still maintained. An annealing process is performed to concentrate the metal layer and further to reduce a thin-film leakage current.
申请公布号 US6232177(B1) 申请公布日期 2001.05.15
申请号 US19990415564 申请日期 1999.10.08
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHANG TING-CHANG;LIU PO-TSUN
分类号 H01L21/02;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/02
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