发明名称 |
Method for increasing surface area of a bottom electrode for a DRAM |
摘要 |
A method of increasing a surface area of a bottom electrode for a DRAM. A polysilicon layer is formed. An etching process is performed and the polysilicon layer is etched into a surface having protrusions in order to increase the surface area of the polysilicon layer. A redox reaction is performed and the etched polysilicon layer is transformed to a metal layer by use of a solution; thus, the original appearance is still maintained. An annealing process is performed to concentrate the metal layer and further to reduce a thin-film leakage current.
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申请公布号 |
US6232177(B1) |
申请公布日期 |
2001.05.15 |
申请号 |
US19990415564 |
申请日期 |
1999.10.08 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
CHANG TING-CHANG;LIU PO-TSUN |
分类号 |
H01L21/02;H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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