发明名称 |
METHOD OF FLATTENING POLYMER LAYER |
摘要 |
PURPOSE: A method of flattening polymer layer is provided to flat photoresist layer without reducing the thickness of a different material layer such as dielectric layer while manufacturing a semiconductor device. CONSTITUTION: A polymer layer which contains photoresist is flattened through a chemical mechanical polishing method. An abrasive composition used in this case is very selective to a dielectric layer, and especially its selection ratio to a silicon nitride layer is about 10:1, preferably at least about 1000:1. This composition is at least of pH 8 or so, preferably pH 11 to 13 or so. A typical abrasive composition can contain abrasive material such as silica or alumina basic solution. An oxidizing component resides as much as 2 wt.%, an abrasive composition can contain a strong base and requires no oxidizing agent or no abrasive material. A proper strong base contains a hydroxide such as a trimethyl ammonium hydroxide or sodium hydroxide.
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申请公布号 |
KR20010039719(A) |
申请公布日期 |
2001.05.15 |
申请号 |
KR20000040460 |
申请日期 |
2000.07.14 |
申请人 |
INFINEON TECHNOLOGIES NORTH AMERICA CORPORATION;INTERNATIONAL BUSINESS MACHINES CORPORATION;KABUSHIKI KAISHA TOSHIBA |
发明人 |
FAIRCHOK CYNTHIA;IBA JUNICHIRO;NUETZEL JOACHIM;YANO HIROYUKI |
分类号 |
B24B37/00;C09G1/02;C09K13/00;H01L21/304;H01L21/306;H01L21/3105;(IPC1-7):H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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