发明名称 TECHNIQUE FOR MINIMIZING GATE CHARGE AND GATE TO DRAIN CAPACITANCE IN POWER MOS DEVICES SUCH AS DMOS, IGBTS AND MOSFETS
摘要 PURPOSE: A technique for minimizing gate charge and gate to drain capacitance in power MOS devices such as DMOS, IGBTs and MOSFETs is provided to lessen in interelectrode capacitance. CONSTITUTION: The power MOS device includes a MOS semiconductor substrate layer having one or more source regions and one or more drain regions, a gate insulator covering the semiconductor substrate, characterized in that a conductive gate on gate insulator, a channel underneath the gate and between a source region and a drain region for passing current between the source and the drain when a voltage is applied to the gate, a means for reducing a capacitance between the gate and drain.
申请公布号 KR20010040186(A) 申请公布日期 2001.05.15
申请号 KR20000063273 申请日期 2000.10.26
申请人 INTERSIL CORPORATION 发明人 BHALLA ANUP
分类号 H01L29/06;H01L29/423;H01L29/739;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/06
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