发明名称 |
METHOD FOR MANUFACTURING PATTERN OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a pattern of a semiconductor device is provided to more freely control a critical dimension of a process and the depth of a trench, by forming a desired pattern on a semiconductor substrate through an etch process, an implantation process, an annealing process and an etch process. CONSTITUTION: An upper portion of a semiconductor substrate(10) is etched to be of a desired shape while the upper portion of the semiconductor substrate is masked. Particles of which molecular weight is heavy, are implanted to the upper portion for doping. The doping-diffused implantation process is etched to be of a desired pattern.
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申请公布号 |
KR20010038738(A) |
申请公布日期 |
2001.05.15 |
申请号 |
KR19990046848 |
申请日期 |
1999.10.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HONG IL;LEE, HYEONG GYU |
分类号 |
H01L21/22;(IPC1-7):H01L21/22 |
主分类号 |
H01L21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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