发明名称 METHOD FOR MANUFACTURING PATTERN OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a pattern of a semiconductor device is provided to more freely control a critical dimension of a process and the depth of a trench, by forming a desired pattern on a semiconductor substrate through an etch process, an implantation process, an annealing process and an etch process. CONSTITUTION: An upper portion of a semiconductor substrate(10) is etched to be of a desired shape while the upper portion of the semiconductor substrate is masked. Particles of which molecular weight is heavy, are implanted to the upper portion for doping. The doping-diffused implantation process is etched to be of a desired pattern.
申请公布号 KR20010038738(A) 申请公布日期 2001.05.15
申请号 KR19990046848 申请日期 1999.10.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HONG IL;LEE, HYEONG GYU
分类号 H01L21/22;(IPC1-7):H01L21/22 主分类号 H01L21/22
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