发明名称 DENSIFICATION METHOD FOR TRENCH ISOLATION
摘要 PURPOSE: A densification method for trench isolation is to provide a gate oxide layer of which a quality is superior, by performing a densification process at a low temperature while guaranteeing a superior trench profile. CONSTITUTION: A trench of a predetermined depth is formed in a field region of a semiconductor substrate. The trench is filled with an insulating material. The surface of the insulating material is planarized, and the semiconductor substrate in an active region is exposed, to complete a trench isolation process. The resultant structure is pre-annealed at a temperature of 1000 deg.C and in a non-oxidizing atmosphere, and is annealed in a wet atmosphere.
申请公布号 KR20010038147(A) 申请公布日期 2001.05.15
申请号 KR19990046018 申请日期 1999.10.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, DONG HO;HONG, SEOK HUN;HONG, SU JIN;KIM, SEONG UI
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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