发明名称 |
DENSIFICATION METHOD FOR TRENCH ISOLATION |
摘要 |
PURPOSE: A densification method for trench isolation is to provide a gate oxide layer of which a quality is superior, by performing a densification process at a low temperature while guaranteeing a superior trench profile. CONSTITUTION: A trench of a predetermined depth is formed in a field region of a semiconductor substrate. The trench is filled with an insulating material. The surface of the insulating material is planarized, and the semiconductor substrate in an active region is exposed, to complete a trench isolation process. The resultant structure is pre-annealed at a temperature of 1000 deg.C and in a non-oxidizing atmosphere, and is annealed in a wet atmosphere.
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申请公布号 |
KR20010038147(A) |
申请公布日期 |
2001.05.15 |
申请号 |
KR19990046018 |
申请日期 |
1999.10.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, DONG HO;HONG, SEOK HUN;HONG, SU JIN;KIM, SEONG UI |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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