发明名称 |
CAPACITOR OF SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A capacitor of a semiconductor memory device is provided to intensify a breakdown voltage of a dielectric layer between a storage electrode and a plate electrode even though mismatching between the storage electrode and a buried contact hole occurs. CONSTITUTION: A substrate(10) has a cell pad(40), which is exposed through a buried contact hole(53) of an interlayer dielectric(50). A storage electrode has a bar pattern(70) and a conductive spacer. The bar pattern is formed on the interlayer dielectric, electrically connected to the cell pad through the buried contact hole. The conductive spacer is formed on a sidewall of the bar pattern. A dielectric layer(80) is formed on the storage electrode. A plate electrode(90) is formed on the storage electrode by interposing the dielectric layer.
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申请公布号 |
KR20010038174(A) |
申请公布日期 |
2001.05.15 |
申请号 |
KR19990046051 |
申请日期 |
1999.10.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SEONG HWAN |
分类号 |
H01L27/108;H01L21/02;H01L21/8242;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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