发明名称 CAPACITOR OF SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A capacitor of a semiconductor memory device is provided to intensify a breakdown voltage of a dielectric layer between a storage electrode and a plate electrode even though mismatching between the storage electrode and a buried contact hole occurs. CONSTITUTION: A substrate(10) has a cell pad(40), which is exposed through a buried contact hole(53) of an interlayer dielectric(50). A storage electrode has a bar pattern(70) and a conductive spacer. The bar pattern is formed on the interlayer dielectric, electrically connected to the cell pad through the buried contact hole. The conductive spacer is formed on a sidewall of the bar pattern. A dielectric layer(80) is formed on the storage electrode. A plate electrode(90) is formed on the storage electrode by interposing the dielectric layer.
申请公布号 KR20010038174(A) 申请公布日期 2001.05.15
申请号 KR19990046051 申请日期 1999.10.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SEONG HWAN
分类号 H01L27/108;H01L21/02;H01L21/8242;(IPC1-7):H01L27/108 主分类号 H01L27/108
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