发明名称 APPARATUS FOR HEATING WAFER
摘要 PURPOSE: An apparatus for heating a wafer is provided to control wafer defects in a soft bake process and a hexa methylene disilazane(HMDS) process, by preventing the wafer from being uniformly heated to obtain a uniform temperature distribution. CONSTITUTION: Heat transfer fluid is filled up inside a heating body(102) in which a wafer(12) to be heated is settled. A heating plate(100) is formed inside the heat transfer fluid to heat the heat transfer fluid. A circulation pump(105) is installed in the heating body to circulate the heat transfer fluid heated by the heating plate so that the heat of the heat transfer fluid is uniformly transferred to a settling plate.
申请公布号 KR20010038001(A) 申请公布日期 2001.05.15
申请号 KR19990045796 申请日期 1999.10.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, DONG UK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
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