CIRCUIT AND METHOD FOR TESTING A DIGITAL SEMI-CONDUCTOR CIRCUIT,申请号KR1020007009020-传众专利搜索

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发明名称	CIRCUIT AND METHOD FOR TESTING A DIGITAL SEMI-CONDUCTOR CIRCUIT
摘要
申请公布号	KR20010040999(A)	申请公布日期	2001.05.15
申请号	KR1020007009020	申请日期	2000.08.17
申请人		发明人
分类号	G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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