发明名称 Precision stage
摘要 A system for precisely positioning and moving a platform relative to a support structure is disclosed herein. The platform is particularly suitable for carrying wafers. Charged particle optics can be attached to the support structure. The platform positioning system comprises a stage, comprising a base, a platform and stage actuators, the stage actuators being coupled to the platform and the platform being coupled to the base; a frame attached to the base; a support structure mechanically coupled to the frame; stage sensors attached to the support structure, for sensing the position of the platform relative to the support structure; and a current control system coupled to the stage sensors and the stage actuators. The current control system may include a predictor for generating an ouptut signal anticipating the actual position of the platform relative to the support structure in real time.
申请公布号 AU3268001(A) 申请公布日期 2001.05.14
申请号 AU20010032680 申请日期 2000.11.03
申请人 ION DIAGNOSTICS, INC. 发明人 GERRY B. ANDEEN;MARTIN E. LEE
分类号 F16D3/56;G01Q30/16;G03F7/20;H01J37/20;H01L21/00;H01L21/027;H01L21/68 主分类号 F16D3/56
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