发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device with no such voltage oscillation as that causing the malfunction of a peripheral device. SOLUTION: Related to a semiconductor device with a pin structure, the impurity concentration gradient of an n+ buffer layer 103 is configured to 2×1018 cm-4 or below. So, an inversion bias voltage is applied, and even if a depletion layer reaches the n+ layer 103, the abrupt enlargement-stop with the depletion layer is suppressed, resulting in suppressed voltage oscillation.
申请公布号 JP2001127308(A) 申请公布日期 2001.05.11
申请号 JP19990305303 申请日期 1999.10.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 MORISHITA KAZUHIRO;SATO KATSUMI;HIRANO NORITOSHI
分类号 H01L29/73;H01L21/331;H01L29/74;H01L29/744;H01L29/861;H01L29/868;(IPC1-7):H01L29/861 主分类号 H01L29/73
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