发明名称 METHOD INTERFERENCE MEASUREMENT OF SHAPE OF OPTICAL PART SURFACE
摘要 interference measurements; determination of coordinates of interference bands on photographs of interferograms. SUBSTANCE: method includes recording in interference pattern by photographic method on transparent carrier, illumination of recorder interferogram within interval of angles from beta to alpha+beta, where alpha - is angle of diffuse light scattering by interferogram, beta is aperture angle of optical system; method includes also analysis of light picture which consists in illumination of interferogram within interval of angle from beta to alpha+beta by red light; interferogram is additionally illuminated by blue light at optical axis of analyzing object. EFFECT: extended functional capabilities of method of observation of interference bands in diffuse scattering. 2 cl, 1 dwg
申请公布号 RU2166730(C2) 申请公布日期 2001.05.10
申请号 RU19980118443 申请日期 1998.10.09
申请人 SIBIRSKAJA GOSUDARSTVENNAJA GEODEZICHESKAJA AKADEM;SIB G GEODEZICHESKAJA AKADEM 发明人 NOSKOV M.F.
分类号 G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/24
代理机构 代理人
主权项
地址
您可能感兴趣的专利