| 摘要 |
measurement technology, production of high-molecular compounds, prediction of physical properties of polymers under various operational conditions. SUBSTANCE: tested material is placed at known temperature T into capacitor primary converter, additional active resistor Rdm is connected in parallel with first capacitor primary measurement converter with tested material in the capacity of dielectric layer. Maximum mean-square-value U2Rm; of voltage of electric fluctuations across its terminals is found and measured by change of value of additional active resistor, analyzed sample is taken out of capacitor primary measurement converter. Distance between its electrodes corresponding to thickness d of sample is set and mean-squarevalue U2RO of voltage of fluctuations across its terminals is measured with additional active resistor Rdm, being connected, dielectric permittivity epsi' and loss tangent of dielectric tgdelta are computed by given formulas. Proposed technique determining dielectric characteristics of polymer materials enables experimental capabilities of analysis of high- molecular compounds to be widened substantially. EFFECT: increased accuracy of measurement of dielectric characteristics of polymers specified by internal fluctuation electromagnetic field of polymer dielectric material. 1 dwg
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